The Table Of Contents, List of Figures and Tables
Appendix D: CCD Depletion Depths
Appendix F: SIS Internal background
A Technique to Measure Trap Characteristics in CCDs Using X-rays. which has been submitted to IEEE Transactions on Electron Devices (accepted). MIT CSR Preprint # CSR-94-31
ASCA New Horizons Paper on the Spectrum of the XRB . : This will appear in the proceedings of the ASCA New Horizons Conference in Tokyo, 1994.MIT CSR Preprint # CSR-94-09
First PASJ paper on XRB (Accepted!):
gendreau@vite.gsfc.nasa.gov
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